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secondary ion mass spectrometry

secondary ion mass spectrometry noun: a technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface.

Noun

secondary ion mass spectrometry (uncountable, abbreviation SIMS)

  1. A technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface

Forms of secondary ion mass spectrometry

abbreviationSIMS

Questions about secondary ion mass spectrometry

What does secondary ion mass spectrometry mean?
Secondary ion mass spectrometry means a technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface.
What part of speech is secondary ion mass spectrometry?
Secondary ion mass spectrometry is a noun.

Words near secondary ion mass spectrometry in the dictionary

  1. secondary industries
  2. secondary industry
  3. secondary infection
  4. secondary infections
  5. secondary intention
  6. secondary ion mass spectrometry
  7. secondary legislation
  8. secondary legislations
  9. secondary liability
  10. secondary literature
  11. secondary market

Source and license

Adapted from Wiktionary: secondary ion mass spectrometry (page history and authors). Text available under the Creative Commons Attribution-ShareAlike 4.0 license. Word.ws reformatted the entry and added links. Wiktionary data of 2026-09-02.

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Cite this entry: “secondary ion mass spectrometry.” Word.ws, https://word.ws/secondary_ion_mass_spectrometry. Based on Wiktionary, CC BY-SA 4.0.